Kim Donguk, Kwon Samyoung, Park Young, Boo Jin-Hyo, Nam Sang-Hun, Joo Yang Tae, Kim Minha, Lee Jaehyeong
J Nanosci Nanotechnol. 2016 May;16(5):4968-72. doi: 10.1166/jnn.2016.12172.
In present work, the effects of the heat treatment on the structural, optical, and thermochromic properties of vanadium oxide films were investigated. Vanadium dioxide (VO2) thin films were deposited on glass substrate by reactive pulsed DC magnetron sputtering from a vanadium metal target in mixture atmosphere of argon and oxygen gas. Various heat treatment conditions were applied in order to evaluate their influence on the crystal phases formed, surface morphology, and optical properties. The films were characterized by an X-ray diffraction (XRD) in order to investigate the crystal structure and identify the phase change as post-annealing temperature of 500-600 degrees C for 5 minutes. Surface conditions of the obtained VO2(M) films were analyzed by field emission scanning electron microscopy (FE-SEM) and the semiconductor-metal transition (SMT) characteristics of the VO2 films were evaluate by optical spectrophotometry in the UV-VIS-NIR, controlling temperature of the films.
在本工作中,研究了热处理对氧化钒薄膜的结构、光学和热致变色性能的影响。通过反应脉冲直流磁控溅射,在氩气和氧气的混合气氛中,从钒金属靶材在玻璃衬底上沉积二氧化钒(VO₂)薄膜。采用各种热处理条件,以评估它们对形成的晶相、表面形貌和光学性能的影响。通过X射线衍射(XRD)对薄膜进行表征,以研究晶体结构,并确定在500 - 600摄氏度退火5分钟后的相变。通过场发射扫描电子显微镜(FE-SEM)分析所得VO₂(M)薄膜的表面状况,并通过在紫外-可见-近红外波段的光学分光光度法,在控制薄膜温度的情况下评估VO₂薄膜的半导体-金属转变(SMT)特性。