Köhler R, Luther J L, Geist J
Appl Opt. 1990 Jul 20;29(21):3130-4. doi: 10.1364/AO.29.003130.
We have designed and tested a simple instrument to measure the diffuse reflectance of good quality optical surfaces such as the surfaces of semiconductor detectors with uncertainties of ~3%. Measurements have been performed on Si photodiodes and on a sample of known reflectance at two different wavelengths.
我们设计并测试了一种简单仪器，用于测量高质量光学表面（如半导体探测器表面）的漫反射率，不确定度约为3%。已在硅光电二极管以及已知反射率的样品上于两个不同波长进行了测量。
