Budde W
National Research Council of Canada, Ottawa, Ontario KA R6.
Appl Opt. 1982 Oct 15;21(20):3699-701. doi: 10.1364/AO.21.003699.
Most methods for testing the linearity of detectors use steps which are small compared with the total linear range of the detector. The uncertainties of each small step accumulate if large flux ratios are considered. For testing the linearity of Si photodiodes for large flux ratios, such a ratio was generated by reflecting a laser beam at two fused quartz surfaces. The ratio between the twice reflected and the incident flux was calculated from the refractive index. Measurements on one Si photodiode are reported.
大多数用于测试探测器线性度的方法所采用的步骤与探测器的总线性范围相比都很小。如果考虑大的通量比，每个小步骤的不确定性会累积起来。为了测试大通量比下硅光电二极管的线性度，通过在两个熔融石英表面反射激光束来产生这样的比例。两次反射通量与入射通量之间的比例由折射率计算得出。报告了对一个硅光电二极管的测量结果。
