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通过基于 In 升华的 NH4Cl 进行化学气相沉积,在 Si(111)上低温生长 In2O3 和 InN 纳米晶体。

Low Temperature Growth of In2O3and InN Nanocrystals on Si(111) via Chemical Vapour Deposition Based on the Sublimation of NH4Cl in In.

机构信息

Department of Mechanical and Manufacturing Engineering, Materials Science Group, Nanostructured Materials and Devices Laboratory, University of Cyprus, P,O, Box 20537, 1678, Nicosia, Cyprus.

出版信息

Nanoscale Res Lett. 2009 Feb 21;4(6):491-7. doi: 10.1007/s11671-009-9266-1.

Abstract

Indium oxide (In2O3) nanocrystals (NCs) have been obtained via atmospheric pressure, chemical vapour deposition (APCVD) on Si(111) via the direct oxidation of In with Ar:10% O2at 1000 °C but also at temperatures as low as 500 °C by the sublimation of ammonium chloride (NH4Cl) which is incorporated into the In under a gas flow of nitrogen (N2). Similarly InN NCs have also been obtained using sublimation of NH4Cl in a gas flow of NH3. During oxidation of In under a flow of O2the transfer of In into the gas stream is inhibited by the formation of In2O3around the In powder which breaks up only at high temperatures, i.e.T > 900 °C, thereby releasing In into the gas stream which can then react with O2leading to a high yield formation of isolated 500 nm In2O3octahedrons but also chains of these nanostructures. No such NCs were obtained by direct oxidation forTG < 900 °C. The incorporation of NH4Cl in the In leads to the sublimation of NH4Cl into NH3and HCl at around 338 °C which in turn produces an efficient dispersion and transfer of the whole In into the gas stream of N2where it reacts with HCl forming primarily InCl. The latter adsorbs onto the Si(111) where it reacts with H2O and O2leading to the formation of In2O3nanopyramids on Si(111). The rest of the InCl is carried downstream, where it solidifies at lower temperatures, and rapidly breaks down into metallic In upon exposure to H2O in the air. Upon carrying out the reaction of In with NH4Cl at 600 °C under NH3as opposed to N2, we obtain InN nanoparticles on Si(111) with an average diameter of 300 nm.

摘要

氧化铟(In2O3)纳米晶体(NCs)可通过大气压化学气相沉积(APCVD),在 Si(111)上直接用 Ar:10% O2 氧化 In 来获得,温度为 1000°C,但也可在 500°C 以下的温度下通过氯化铵(NH4Cl)的升华来获得,在氮气(N2)气流下,NH4Cl 被掺入 In 中。同样,使用 NH3 气流中 NH4Cl 的升华也可以获得 InN NCs。在 O2 气流下氧化 In 时,由于 In 粉末周围形成了 In2O3,从而抑制了 In 向气流中的转移,只有在高温下(即 T > 900°C),In2O3 才会分解,从而将 In 释放到气流中,然后与 O2 反应,生成高产量的孤立 500nm In2O3 八面体,但也会生成这些纳米结构的链。对于 TG < 900°C 的直接氧化,没有获得这种 NCs。NH4Cl 的掺入会导致 NH4Cl 在 338°C 左右升华成 NH3 和 HCl,这反过来又会有效地将整个 In 分散并转移到 N2 气流中,在那里它与 HCl 反应形成主要的 InCl。后者吸附在 Si(111)上,在那里它与 H2O 和 O2 反应,在 Si(111)上形成 In2O3 纳米金字塔。其余的 InCl 被带到下游,在那里它在较低的温度下凝固,并在暴露于空气中的 H2O 时迅速分解成金属 In。在 NH3 而不是 N2 下,在 600°C 下进行 In 与 NH4Cl 的反应,我们在 Si(111)上获得了平均直径为 300nm 的 InN 纳米颗粒。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/6b3c/3242497/55f85b0f3291/1556-276X-4-491-1.jpg

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