Ojala K T, Koski E, Lampinen M J
Appl Opt. 1992 Aug 1;31(22):4582-9. doi: 10.1364/AO.31.004582.
A method of measuring the total reflection and transmission spectra of scattering materials with an integrating sphere and a Fourier-transform infrared spectrometer is studied. The reflectance measurement system is considered in a specific case where the incident beam overfills the back side port of the sphere, and the correction functions for measured spectra are derived for this case. Correction formulas are based on the energy balance between incident radiation and absorbed or escaped radiation in the system. The absorption spectrum of the material is calculated from the corrected spectra. The optical properties of paper samples and radiating surfaces of infrared dryers in the 0.4-20-microm wavelength range are determined. The correction formulas are compared with previous work presented in the literature.
研究了一种利用积分球和傅里叶变换红外光谱仪测量散射材料全反射和透射光谱的方法。在入射光束过度填充积分球背面端口的特定情况下考虑反射率测量系统，并针对此情况推导了测量光谱的校正函数。校正公式基于系统中入射辐射与吸收或逸出辐射之间的能量平衡。根据校正后的光谱计算材料的吸收光谱。测定了纸样和红外干燥器辐射表面在0.4 - 20微米波长范围内的光学特性。将校正公式与文献中之前发表的工作进行了比较。
