Bolt R A, Ten Bosch J J
Appl Opt. 1993 Aug 20;32(24):4641-5. doi: 10.1364/AO.32.004641.
The position dependence of volume reflection caused by the illumination of a turbid material by a pencil beam of light yields information about the optical parameters of that material. Existing methods to measure the position dependence of the volume-reflection profile usually require scanning the sample surface and are hardly applicable to the area near the illuminating pencil beam. This paper describes an experimental set up based on a two-dimensional CCD camera with 14-bit dynamic range and a spatial resolution down to 20 µm. As a demonstration of its use, measurements are compared with theoretical results from the random-walk and diffusion theories. The conclusions are made that the equipment is suitable for measuring close to the illuminating beam without the need for scanning and that it gives an indication in terms of the product of radial distance toward the center of the beam and reduced scattering coefficient (rµ(s)') for the area where the theoretical results presented are valid.
由铅笔状光束照射混浊材料引起的体积反射的位置依赖性可产生有关该材料光学参数的信息。现有的测量体积反射轮廓位置依赖性的方法通常需要扫描样品表面，并且几乎不适用于照射铅笔状光束附近的区域。本文描述了一种基于二维CCD相机的实验装置，该相机具有14位动态范围和低至20 µm的空间分辨率。作为其应用的演示，将测量结果与随机游走和扩散理论的理论结果进行了比较。得出的结论是，该设备适用于在无需扫描的情况下靠近照射光束进行测量，并且对于所呈现理论结果有效的区域，它给出了朝向光束中心的径向距离与约化散射系数（rµ(s)'）乘积的指示。
