Rajapaksa I, Uenal K, Wickramasinghe H Kumar
Department of Electrical Engineering and Computer Science, University of California, Irvine, California 92697, USA.
Appl Phys Lett. 2010 Aug 16;97(7). doi: 10.1063/1.3480608. Epub 2010 Aug 20.
We demonstrate a technique in microscopy which extends the domain of atomic force microscopy to optical spectroscopy at the nanometer scale. We show that molecular resonance of feature sizes down to the single molecular level can be detected and imaged purely by mechanical detection of the force gradient between the interaction of the optically driven molecular dipole and its mirror image in a platinum coated scanning probe tip. This microscopy and spectroscopy technique is extendable to frequencies ranging from radio to infrared and the ultraviolet.
我们展示了一种显微镜技术，该技术将原子力显微镜的领域扩展到纳米尺度的光谱学。我们表明，通过机械检测光学驱动的分子偶极与其在涂有铂的扫描探针尖端中的镜像相互作用之间的力梯度，就可以检测和成像低至单分子水平的特征尺寸的分子共振。这种显微镜和光谱技术可扩展到从无线电波到红外以及紫外线的频率范围。
