使用低温离子研磨法制备用于透射电子显微镜的多孔金标本。
Specimen preparation of porous Au for transmission electron microscopy using cryo ion-milling.
作者信息
Tanabe Toyokazu
机构信息
Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan.
出版信息
J Electron Microsc (Tokyo). 2011;60(1):35-7. doi: 10.1093/jmicro/dfq070. Epub 2010 Oct 5.
PMID:20923871
Abstract
Porous Au specimens suitable for transmission electron microscopic investigations were prepared by the Ar ion-milling equipped with a cryo-system. The cryo technique enabled the preparation of an artifact-free specimen, avoiding the deposition of Au particles induced by ion-milling. This result demonstrates that cooling is necessary for defect-free preparation of the specimens.
摘要
通过配备低温系统的氩离子研磨制备了适用于透射电子显微镜研究的多孔金标本。低温技术能够制备无假象的标本，避免了离子研磨引起的金颗粒沉积。这一结果表明，冷却对于无缺陷地制备标本是必要的。
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