Märki Iwan, Bocchio Noelia L, Geissbuehler Stefan, Aguet François, Bilenca Alberto, Lasser Theo
Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland.
Opt Express. 2010 Sep 13;18(19):20263-72. doi: 10.1364/OE.18.020263.
We present a combination of self-interference microscopy with lateral super-resolution microscopy and introduce a novel approach for localizing a single nano-emitter to within a few nanometers in all three dimensions over a large axial range. We demonstrate nanometer displacements of quantum dots placed on top of polymer bilayers that undergo swelling when changing from an air to a water environment, achieving standard deviations below 10 nm for axial and lateral localization.
我们展示了自干涉显微镜与横向超分辨率显微镜的结合，并引入了一种新方法，可在较大轴向范围内将单个纳米发射器在所有三个维度上定位到几纳米以内。我们展示了置于聚合物双层顶部的量子点的纳米级位移，当从空气环境转变为水环境时，聚合物双层会发生溶胀，轴向和横向定位的标准差均低于10纳米。
