光盘基板双折射的波长依赖性测量。

Measurement of the wavelength dependence of birefringence for optical disk substrates.

作者信息

Fu H, Yan Z, Mansuripur M

出版信息

Appl Opt. 1994 Nov 1;33(31):7406-11. doi: 10.1364/AO.33.007406.

DOI:10.1364/AO.33.007406

PMID:20941302

Abstract

The in-plane and vertical birefringence of polycarbonate plastic substrates of optical disks are measured for wavelengths between 360 and 860 nm, which covers the full range of interest for blue as well as for the current red and infrared recording. It is found that the birefringence generally decreases as the measurement wavelength is increased. In a typical case, the in-plane birefringence, Δn‖ goes from 1.7 × 10(-5) to 1.2 × 10(-5), and the vertical birefringence, Δn⊥, drops from 7.5 δ 10(4-) to 5.7 × 10(4-) in the wavelength range from 360 to 860 nm.

摘要

测量了光盘聚碳酸酯塑料基板在360至860纳米波长范围内的面内双折射和垂直双折射，该波长范围涵盖了蓝光以及当前红光和红外记录的所有感兴趣波段。结果发现，双折射通常随着测量波长的增加而减小。在一个典型案例中，在360至860纳米的波长范围内，面内双折射Δn‖从1.7×10⁻⁵降至1.2×10⁻⁵，垂直双折射Δn⊥从7.5×10⁻⁴降至5.7×10⁻⁴。