Horie M
Appl Opt. 1995 Sep 1;34(25):5715-9. doi: 10.1364/AO.34.005715.
In a coated and laminated optical disk, only a reflectance method is available for oblique incidence retardation measurements to evaluate the birefringence in a polycarbonate substrate. I propose a simple measurement method that simultaneously measures both the lateral and vertical birefringence in a coated substrate. In this reflectance method, only two oblique incidence retardation values with a fixed incident angle are measured from the radial and the circumferential directions of the disk. Using the sum and the difference of these two retardation values, we can calculate both birefringences without any cumbersome curve-fitting procedure. This method can easily be introduced into the routine inspection for optical disk manufacturing.
在涂覆和层压光盘中，对于倾斜入射延迟测量，只有反射率法可用于评估聚碳酸酯基板中的双折射。我提出了一种简单的测量方法，可同时测量涂覆基板中的横向和纵向双折射。在这种反射率法中，仅从光盘的径向和圆周方向测量两个具有固定入射角的倾斜入射延迟值。利用这两个延迟值的和与差，我们无需任何繁琐的曲线拟合程序就能计算出双折射。该方法可轻松引入光盘制造的常规检测中。
