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光盘基板双折射的温度依赖性。

Temperature dependence of the birefringence of optical-disk substrates.

作者信息

Goodman T D, Gerber R E, Mansuripur M

出版信息

Appl Opt. 1996 Jun 1;35(16):3031-8. doi: 10.1364/AO.35.003031.

Abstract

Injection-molded polycarbonate substrates are used predominantly in read-only, write-once, phase-change and magneto-optic disks for data storage. The in-plane and vertical birefringences of these substrates adversely affect the performance of optical data-storage systems. The disks are typically expected to operate in the ambient temperature range of 5-50 °C. We have investigated the behavior of the in-plane and vertical birefringences of a polycarbonate disk substrate in this temperature range using a custom-built ellipsometer. This study reveals that the in-plane birefringence changes dramatically within the investigated range of temperatures, whereas the vertical birefringence remains essentially constant. We suspect that the change in birefringence is due primarily to thermally induced stress in the substrate.

摘要

注塑聚碳酸酯基板主要用于只读、一次写入、相变和磁光盘的数据存储。这些基板的面内双折射和垂直双折射会对光学数据存储系统的性能产生不利影响。通常期望这些磁盘在5-50°C的环境温度范围内运行。我们使用定制的椭偏仪研究了聚碳酸酯磁盘基板在该温度范围内的面内双折射和垂直双折射行为。这项研究表明,在所研究的温度范围内,面内双折射变化显著,而垂直双折射基本保持不变。我们怀疑双折射的变化主要是由于基板中的热致应力。

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