Cova S, Ghioni M, Lacaita A, Samori C, Zappa F
Appl Opt. 1996 Apr 20;35(12):1956-76. doi: 10.1364/AO.35.001956.
Avalanche photodiodes, which operate above the breakdown voltage in Geiger mode connected with avalanche-quenching circuits, can be used to detect single photons and are therefore called singlephoton avalanche diodes SPAD's. Circuit configurations suitable for this operation mode are critically analyzed and their relative merits in photon counting and timing applications are assessed. Simple passive-quenching circuits (PQC's), which are useful for SPAD device testing and selection, have fairly limited application. Suitably designed active-quenching circuits (AQC's) make it possible to exploit the best performance of SPAD's. Thick silicon SPAD's that operate at high voltages (250-450 V) have photon detection efficiency higher than 50% from 540- to 850-nm wavelength and still ~3% at 1064 nm. Thin silicon SPAD's that operate at low voltages (10-50 V) have 45% efficiency at 500 nm, declining to 10% at 830 nm and to as little as 0.1% at 1064 nm. The time resolution achieved in photon timing is 20 ps FWHM with thin SPAD's; it ranges from 350 to 150 ps FWHM with thick SPAD's. The achieved minimum counting dead time and maximum counting rate are 40 ns and 10 Mcps with thick silicon SPAD's, 10 ns and 40 Mcps with thin SPAD's. Germanium and III-V compound semiconductor SPAD's extend the range of photon-counting techniques in the near-infrared region to at least 1600-nm wavelength.
雪崩光电二极管在盖革模式下工作于击穿电压之上,并与雪崩猝灭电路相连,可用于探测单光子,因此被称为单光子雪崩二极管(SPAD)。对适用于这种工作模式的电路配置进行了严格分析,并评估了它们在光子计数和定时应用中的相对优点。简单的无源猝灭电路(PQC)对SPAD器件测试和选择很有用,但应用相当有限。经过适当设计的有源猝灭电路(AQC)能够发挥SPAD的最佳性能。工作在高电压(250 - 450V)下的厚硅SPAD在540至850nm波长范围内的光子探测效率高于50%,在1064nm时仍约为3%。工作在低电压(10 - 50V)下的薄硅SPAD在500nm时效率为45%,在830nm时降至10%,在1064nm时低至0.1%。薄SPAD在光子定时方面实现的时间分辨率为20ps半高宽;厚SPAD的时间分辨率范围为350至150ps半高宽。厚硅SPAD实现的最小计数死时间和最大计数率分别为40ns和10Mcps,薄SPAD为10ns和40Mcps。锗和III - V族化合物半导体SPAD将近红外区域的光子计数技术范围扩展到至少1600nm波长。