Lee Byunghun, Lee Kang-Ho, Lee Jeong-Oen, Sohn Mi-Jin, Choi Suk-Hwan, Wang Se-Won, Yoon Jun-Bo, Cho Gyu-Hyeong
School of EECS, Korea Advanced Institution of Science and Technology (KAIST), Korea.
Annu Int Conf IEEE Eng Med Biol Soc. 2010;2010:6547-50. doi: 10.1109/IEMBS.2010.5627101.
This paper presents fully integrated label-free DNA recognition circuit based on capacitance measurement. A CMOS-based DNA sensor is implemented for the electrical detection of DNA hybridization. The proposed architecture detects the difference of capacitance through the integration of current mismatch of capacitance between reference electrodes functionalized with only single-stranded DNA and sensing electrodes bound with complementary DNA strands specifically. In addition, to minimize the effects of parallel resistance between electrodes and DNA layers, the compensation technique of leakage current through the use of constant current charging and discharging is implemented in the proposed detection circuit. The chip was fabricated in 0.35um 4-metal 2-poly CMOS process, and 16 × 8 sensing electrode arrays were fabricated by post-processing steps.
本文介绍了一种基于电容测量的完全集成无标记DNA识别电路。实现了一种基于CMOS的DNA传感器用于DNA杂交的电学检测。所提出的架构通过专门集成仅用单链DNA功能化的参考电极与与互补DNA链结合的传感电极之间电容的电流失配来检测电容差异。此外，为了最小化电极与DNA层之间并联电阻的影响，在所提出的检测电路中采用了通过恒流充电和放电来补偿漏电流的技术。该芯片采用0.35um 4金属2多晶硅CMOS工艺制造，通过后处理步骤制造了16×8传感电极阵列。
