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Reflectance of a wideband multilayer x-ray mirror at normal and grazing incidences.

作者信息

Seely J F, Kowalski M P, Hunter W R, Gutman G

出版信息

Appl Opt. 1996 Aug 1;35(22):4408-12. doi: 10.1364/AO.35.004408.

Abstract

The reflectance of a W-B(4)C multilayer mirror, with a period thickness that increased with depth into the multilayer, was measured at near-normal incidence with synchrotron radiation and at grazing incidence with Cu Kα radiation. The period thickness increased linearly from 17.9 Å at the top of the multilayer structure to 21.9 Å at the substrate while the same ratio of nodal layer to period thickness was maintained. For a grazing angle of 80° (10° from normal incidence), the peak reflectance was 1.1% at a wavelength of 36 Å, and the reflectance profile was 1 Å wide. For Cu Kα radiation the reflectance peaked at a grazing angle of 2.4° and was 0.4° wide. Compared with a W-B(4)C multilayer mirror with a constant period thickness, the depth-graded multilayer mirror has wider reflectance profiles at near-normal and grazing incidences, resulting in larger integrated reflectances and wider fields of view.

摘要

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