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Complementary metal-oxide semiconductor (CMOS) image sensor: an insight as a point-of-care label-free immunosensor.

作者信息

Kandasamy Karthikeyan, Marimuthu Mohana, Sung Gun Yong, Ahn Chang Geun, Kim Sanghyo

机构信息

College of Bionanotechnology, Kyungwon University, Seongnam si, Gyeonggi do, Republic of Korea.

出版信息

Anal Sci. 2010;26(12):1215-7. doi: 10.2116/analsci.26.1215.

DOI:10.2116/analsci.26.1215
PMID:21157088
Abstract

The present paper examines the efficiency of a complementary metal-oxide semiconductor (CMOS) using an indium nanoparticle (InNP) substrate for the high-sensitivity detection of antigen/antibody interactions at concentrations as low as 100 pg/ml under normal light. Metal NPs coated with antigen/antibody layers act as a dielectric layer on the conducting sphere, which enhances the number of photons hitting the sensor surface through a light-scattering effect. This photon number is proportional to the digital number observed with the CMOS sensor for detecting antigen/antibody interactions.

摘要

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