Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, IL 61801, USA.
Ultramicroscopy. 2011 Jun;111(7):817-23. doi: 10.1016/j.ultramic.2010.10.013. Epub 2010 Nov 20.
Information from imaging and diffraction planes, or real and reciprocal spaces, of transmission electron microscopes (TEM) can be combined using iterative transformation algorithms to reconstruct the complex wave function, to improve image resolution and to remove residual aberrations in the case of aberration corrected TEM. Here, we describe the experimental and computation techniques needed for combining real and reciprocal space information. We demonstrate these techniques by reconstructing the complex wave function of quantum dots and carbon nanotubes beyond the microscope's resolution limit.
透射电子显微镜（TEM）的成像和衍射平面，或实空间和倒易空间的信息，可以使用迭代变换算法进行组合，以重构复杂的波函数，提高图像分辨率，并在具有像差校正的 TEM 的情况下消除残余像差。在这里，我们描述了组合实空间和倒易空间信息所需的实验和计算技术。我们通过重构量子点和碳纳米管的复波函数来证明这些技术超越了显微镜的分辨率极限。
