Institute of Technical Physics and Materials Science, Centre for Energy Research, Budapest, Hungary.
Microsc Res Tech. 2023 Feb;86(2):144-156. doi: 10.1002/jemt.24229. Epub 2022 Sep 7.
The achievement of this work is that fine tuning of experimental and evaluation parameters can improve the absolute accuracy and reproducibility of selected area electron diffraction (SAED) to 0.1% without using internal standard. Due to the proposed procedure it was possible to reach a reproducibility better than 0.03% for camera length between sessions by careful control of specimen height and illumination conditions by monitoring lens currents. We applied a calibration specimen composed of nanocrystalline grains free of texture and providing narrow diffraction rings. Refinements of the centre of the diffraction pattern and corrections for elliptic ring distortions allowed for determining the ring diameters with an accuracy of 0.1%. We analyze the effect of different error sources and reason the achieved absolute accuracy of the measurement. Application of the proposed evaluation procedure is inevitable in case of multicomponent nanocomposites or textured materials and/or having close diffraction rings where application of automated procedures is limited. The achieved accuracy of 0.1% without internal standard is approaching that of routine laboratory XRD, and reduction of instrumental broadening due to the elaborated evaluation procedure allows for separation of close reflections, provides more reliable ring width and thus improved input parameters for further nanostructure analysis as demonstrated on dental enamel bioapatite.
这项工作的成就在于,通过微调实验和评估参数,可以在不使用内标物的情况下,将选区电子衍射(SAED)的绝对精度和重现性提高到 0.1%。由于采用了所提出的程序,通过仔细控制样品高度和照明条件,并通过监测透镜电流,在不同批次之间的相机长度重现性可以达到优于 0.03%。我们使用了由无织构的纳米晶颗粒组成的校准样品,这些颗粒提供了窄的衍射环。对衍射图案中心的细化和对椭圆环变形的修正,使得可以以 0.1%的精度确定环直径。我们分析了不同误差源的影响,并解释了测量的绝对精度。在多组分纳米复合材料或织构材料以及/或具有接近的衍射环的情况下,应用自动化程序受到限制,因此必须采用所提出的评估程序。在没有内标物的情况下达到 0.1%的精度,接近常规实验室 XRD 的精度,并且由于详细的评估程序减少了仪器展宽,可以分离接近的反射,提供更可靠的环宽,从而为进一步的纳米结构分析提供了改进的输入参数,如在牙釉质生物磷灰石上所示。