School of Electrical and Computer Engineering, Cornell University, Ithaca, New York 14853, USA.
Opt Lett. 2011 Jan 1;36(1):4-6. doi: 10.1364/OL.36.000004.
Stimulated emission from sensitized erbium ions in silicon-rich silicon nitride is demonstrated by pump-probe measurements carried out in waveguides. A decrease in the photoinduced absorption of the probe at the wavelength of erbium emission is observed and is attributed to stimulated emission from erbium excited indirectly via localized states in the silicon nitride matrix.
通过在波导中进行的泵浦探测测量，证明了富硅氮化硅中敏化铒离子的受激发射。观察到探针在铒发射波长处的光致吸收减少，这归因于通过氮化硅基质中的局域态间接激发铒而产生的受激发射。
