Satzinger Kevin J, Brown Keith A, Westervelt Robert M
J Appl Phys. 2012 Sep 15;112(6):64510. doi: 10.1063/1.4754313. Epub 2012 Sep 26.
A realistic interpretation of the measured contact potential difference (CPD) in Kelvin probe force microscopy (KPFM) is crucial in order to extract meaningful information about the sample. Central to this interpretation is a method to include contributions from the macroscopic cantilever arm, as well as the cone and sharp tip of a KPFM probe. Here, three models of the electrostatic interaction between a KPFM probe and a sample are tested through an electrostatic simulation and compared with experiment. In contrast with previous studies that treat the KPFM cantilever as a rigid object, we allow the cantilever to bend and rotate; accounting for cantilever bending provides the closest agreement between theory and experiment. We demonstrate that cantilever dynamics play a major role in CPD measurements and provide a simulation technique to explore this phenomenon.
为了从样品中提取有意义的信息,对开尔文探针力显微镜(KPFM)中测量的接触电势差(CPD)进行现实的解释至关重要。这种解释的核心是一种方法,该方法要考虑宏观悬臂臂以及KPFM探针的锥体和尖锐尖端的贡献。在这里,通过静电模拟测试了KPFM探针与样品之间静电相互作用的三种模型,并与实验进行了比较。与之前将KPFM悬臂视为刚性物体的研究不同,我们允许悬臂弯曲和旋转;考虑悬臂弯曲能使理论与实验之间达成最紧密的一致。我们证明悬臂动力学在CPD测量中起主要作用,并提供了一种模拟技术来探索这一现象。