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对人体皮肤单频 LCR 数据桥阻抗测量的批判性分析。

A critical analysis of single-frequency LCR databridge impedance measurements of human skin.

机构信息

Chemical Engineering Department, Colorado School of Mines, Golden, CO 80401, USA.

出版信息

Toxicol In Vitro. 2011 Jun;25(4):774-84. doi: 10.1016/j.tiv.2011.01.013. Epub 2011 Jan 27.

Abstract

Testing whether the barrier of skin samples has sufficient integrity for meaningful measurements of in-vitro chemical permeability is usually required when data are generated for regulatory purposes. Recently, skin integrity has been assessed using LCR databridge measurements, which are reported as resistances determined in either series (SER) or parallel (PAR) modes at a single frequency, typically 100 or 1000Hz. Measurements made at different combinations of mode and frequency are known to differ, although the skin literature reveals confusion over the meaning of these differences and the impact on the interpretation of integrity test results. Here, the theoretical meanings of resistance and capacitance measurements in PAR and SER mode are described and confirmed experimentally. SER-mode resistances are equal to the real part of the complex impedance; whereas, PAR-mode resistances are the inverse of the real part of the admittance. Capacitance measurements reported in SER and PAR modes are similar manipulations of the imaginary parts of the complex impedance and admittance. A large body of data from human cadaver skin is used to show that the PAR-mode resistance and SER-mode capacitance measured at 100Hz are sensitive to skin resistivity, which is the electrical measurement most closely related to skin integrity.

摘要

当为监管目的生成数据时,通常需要测试皮肤样本的屏障是否具有足够的完整性,以进行体外化学渗透性的有意义测量。最近,使用 LCR 数据桥测量来评估皮肤完整性,这些测量结果以串联 (SER) 或并联 (PAR) 模式在单个频率下报告为电阻,通常为 100 或 1000Hz。尽管皮肤文献揭示了对这些差异的含义以及对完整性测试结果解释的影响存在混淆,但已知不同模式和频率组合下的测量结果会有所不同。在这里,描述了 PAR 和 SER 模式下电阻和电容测量的理论含义,并通过实验进行了验证。SER 模式下的电阻等于复阻抗的实部;而 PAR 模式下的电阻是导纳实部的倒数。SER 和 PAR 模式下报告的电容测量是对复阻抗和导纳的虚部的类似操作。大量来自人体尸体皮肤的数据被用于表明在 100Hz 下测量的 PAR 模式电阻和 SER 模式电容对皮肤电阻率敏感,皮肤电阻率是与皮肤完整性最密切相关的电学测量。

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