Department of Physics, LASSP, Cornell University, Ithaca, NY 14853, USA.
J Synchrotron Radiat. 2011 Mar;18(Pt 2):157-64. doi: 10.1107/S090904951004104X. Epub 2010 Nov 25.
Dynamic X-ray studies can reach temporal resolutions limited by only the X-ray pulse duration if the detector is fast enough to segregate synchrotron pulses. An analog integrating pixel array detector with in-pixel storage and temporal resolution of around 150 ns, sufficient to isolate pulses, is presented. Analog integration minimizes count-rate limitations and in-pixel storage captures successive pulses. Fundamental tests of noise and linearity as well as high-speed laser measurements are shown. The detector resolved individual bunch trains at the Cornell High Energy Synchrotron Source at levels of up to 3.7 × 10(3) X-rays per pixel per train. When applied to turn-by-turn X-ray beam characterization, single-shot intensity measurements were made with a repeatability of 0.4% and horizontal oscillations of the positron cloud were detected.
如果探测器足够快以分离同步加速器脉冲,那么动态 X 射线研究可以达到仅受 X 射线脉冲持续时间限制的时间分辨率。本文介绍了一种具有像素内存储和约 150ns 时间分辨率的模拟积分像素阵列探测器,足以隔离脉冲。模拟积分最小化了计数率限制,而像素内存储则捕获了连续的脉冲。展示了噪声和线性度的基本测试以及高速激光测量。该探测器在康奈尔高能同步加速器光源(Cornell High Energy Synchrotron Source)的水平上,以高达每个像素每束 3.7×10(3)X 射线的水平,解析了单个束列。当应用于逐圈 X 射线束特性化时,单次强度测量的重复性为 0.4%,并检测到正电子云的水平摆动。