Green Katherine S, Szebenyi Doletha M E, Boggs Kasey, Bredthauer Richard, Tate Mark W, Gruner Sol M
Department of Physics, Cornell University, Ithaca, NY 14853, USA.
J Appl Crystallogr. 2013 Aug 1;46(Pt 4):1038-1048. doi: 10.1107/S0021889813016592. Epub 2013 Jul 18.
The fabrication and testing of a prototype deep-depletion direct-conversion X-ray CCD detector are described. The device is fabricated on 600 µm-thick high-resistivity silicon, with 24 × 24 µm pixels in a 4k × 4k pixel format. Calibration measurements and the results of initial protein crystallography experiments at the Cornell High Energy Synchrotron Source (CHESS) F1 beamline are described, as well as suggested improvements for future versions of the detector.
本文描述了一种深耗尽型直接转换X射线电荷耦合器件(CCD)探测器原型的制造与测试。该器件基于600微米厚的高电阻率硅制造,采用4k×4k像素格式,像素尺寸为24×24微米。文中介绍了在康奈尔高能同步辐射源(CHESS)F1光束线进行的校准测量以及初始蛋白质晶体学实验结果,还针对探测器的未来版本提出了改进建议。