Yamaguchi M, Ito M, Miwata T, Horiba N, Matsumoto T, Nakamura H, Fukaya M
Department of Endodontics, School of Dentistry, Aichi-Gakuin University, Nagoya, Japan.
Aichi Gakuin Daigaku Shigakkai Shi. 1990 Jun;28(2):703-7.
This study was conducted to evaluate the results of treating hypersensitive dentin with a GaAlAs semiconductor laser diode using the double blind test. For this purpose, sixty-seven teeth were examined. Thirty of the teeth were treated with laser irradiation (active group), while the other 36 were not (dummy group). The irradiation equipment was obtained from J. Morita Co. and operated at a continuous wavelength of 790 nm and a laser strength of 30 mW. The following results were obtained: After two hours of laser irradiation, 40% of the active group and 13.9% of the dummy group showed effective results. After one day, these values were 36.9% and 13.9%, and after 5 days, 43.3% and 19.4%, respectively. A overall evaluation indicated these values to be 60.0% and 22.2%, respectively. In evaluating these four results, significant differences are apparent between the active and dummy groups. The present results indicate that laser irradiation may possibly be effective in decreasing pain when treating hypersensitive dentin.
本研究旨在通过双盲试验评估使用镓铝砷半导体激光二极管治疗牙本质过敏症的效果。为此，检查了67颗牙齿。其中30颗牙齿接受了激光照射（治疗组），而另外36颗未接受照射（对照组）。照射设备购自日本森田公司，工作波长为790nm，连续波，激光强度为30mW。结果如下：激光照射两小时后，治疗组40%的牙齿和对照组13.9%的牙齿显示出有效结果。一天后，这些数值分别为36.9%和13.9%，五天后分别为43.3%和19.4%。总体评估表明这些数值分别为60.0%和22.2%。在评估这四个结果时，治疗组和对照组之间存在明显的显著差异。目前的结果表明，激光照射在治疗牙本质过敏症时可能对减轻疼痛有效。
