Tono Kensuke, Kudo Togo, Yabashi Makina, Tachibana Takeshi, Feng Yiping, Fritz David, Hastings Jerome, Ishikawa Tetsuya
SPring-8∕RIKEN, Sayo-cho, Sayo-gun, Hyogo, Japan.
Rev Sci Instrum. 2011 Feb;82(2):023108. doi: 10.1063/1.3549133.
We have developed an x-ray beam-position monitor for detecting the radiation properties of an x-ray free electron laser (FEL). It is composed of four PIN photodiodes that detect backscattered x-rays from a semitransparent diamond film placed in the beam path. The signal intensities from the photodiodes are used to compute the beam intensity and position. A proof-of-principle experiment at a synchrotron light source revealed that the error in the beam position is reduced to below 7 μm by using a nanocrystal diamond film prepared by plasma-enhanced chemical vapor deposition. Owing to high dose tolerance and transparency of the diamond film, the monitor is suitable for routine diagnostics of extremely intense x-ray pulses from the FEL.
我们开发了一种用于检测X射线自由电子激光（FEL）辐射特性的X射线束位置监测器。它由四个PIN光电二极管组成，这些光电二极管用于检测放置在光束路径中的半透明金刚石薄膜背散射的X射线。光电二极管的信号强度用于计算光束强度和位置。在同步加速器光源上进行的原理验证实验表明，通过使用等离子体增强化学气相沉积制备的纳米晶金刚石薄膜，光束位置误差可降低至7μm以下。由于金刚石薄膜具有高剂量耐受性和透明度，该监测器适用于对FEL产生的极强X射线脉冲进行常规诊断。
