使用校准成像板进行高能X射线背光源光谱测量。

High-energy x-ray backlighter spectrum measurements using calibrated image plates.

作者信息

Maddox B R, Park H S, Remington B A, Izumi N, Chen S, Chen C, Kimminau G, Ali Z, Haugh M J, Ma Q

机构信息

Lawrence Livermore National Laboratory, Livermore, California 94550, USA.

出版信息

Rev Sci Instrum. 2011 Feb;82(2):023111. doi: 10.1063/1.3531979.

DOI:10.1063/1.3531979

PMID:21361577

Abstract

The x-ray spectrum between 18 and 88 keV generated by a petawatt laser driven x-ray backlighter target was measured using a 12-channel differential filter pair spectrometer. The spectrometer consists of a series of filter pairs on a Ta mask coupled with an x-ray sensitive image plate. A calibration of Fuji™ MS and SR image plates was conducted using a tungsten anode x-ray source and the resulting calibration applied to the design of the Ross pair spectrometer. Additionally, the fade rate and resolution of the image plate system were measured for quantitative radiographic applications. The conversion efficiency of laser energy into silver Kα x rays from a petawatt laser target was measured using the differential filter pair spectrometer and compared to measurements using a single photon counting charge coupled device.

摘要

使用12通道差分滤光片对光谱仪测量了拍瓦激光驱动的X射线背光源靶产生的18至88keV之间的X射线光谱。该光谱仪由钽掩膜上的一系列滤光片对与X射线敏感成像板组成。使用钨阳极X射线源对富士™ MS和SR成像板进行了校准，并将所得校准结果应用于罗斯滤光片对光谱仪的设计。此外，还测量了成像板系统的褪色率和分辨率，以用于定量射线照相应用。使用差分滤光片对光谱仪测量了拍瓦激光靶中激光能量转化为银Kα X射线的转换效率，并与使用单光子计数电荷耦合器件的测量结果进行了比较。