Department of Electro-Optical Engineering, National Taipei University of Technology, Taipei, Taiwan.
Opt Lett. 2011 Mar 15;36(6):1014-6. doi: 10.1364/OL.36.001014.
Thin films are fabricated from arrays of silver nanorods with thicknesses of 160 nm and 200 nm, to function as a metamaterial. The negative refractive index and negative permeability are retrieved from measured reflection and transmission coefficients using walk-off interferometer in the visible regime. A negative-index-material thin film with negative permittivity or (and) permeability can be produced by glancing angle deposition.
采用厚度为 160nm 和 200nm 的银纳米棒阵列制备薄膜,用作超材料。在可见光范围内,采用离轴干涉仪从测量的反射和透射系数中提取负折射率和负磁导率。通过掠角沉积可以产生具有负介电常数或(和)磁导率的负折射率材料薄膜。