通过接触共振力显微镜连续测量原子力显微镜探针磨损 - Suppr | 超能文献

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Continuous measurement of atomic force microscope tip wear by contact resonance force microscopy.通过接触共振力显微镜连续测量原子力显微镜探针磨损

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Characteristics of fracture during the approach process and wear mechanism of a silicon AFM tip.硅原子力显微镜探针在接近过程中的断裂特性及磨损机制

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Mechanics of interaction and atomic-scale wear of amplitude modulation atomic force microscopy probes.振幅调制原子力显微镜探针的相互作用和原子级磨损机理。

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Effect of contact stiffness on wedge calibration of lateral force in atomic force microscopy.接触刚度对原子力显微镜侧向力楔形校准的影响。

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Plastic tip arrays for force spectroscopy.用于力谱学的塑料尖端阵列。

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Chemical modifications of atomic force microscopy tips.原子力显微镜探针的化学修饰。

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Wear-resistant diamond nanoprobe tips with integrated silicon heater for tip-based nanomanufacturing.具有集成硅加热器的耐磨金刚石纳米探针尖端，用于基于尖端的纳米制造。

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Mechanically engraved mica surface using the atomic force microscope tip facilitates return to a specific sample location.使用原子力显微镜尖端对云母表面进行机械刻蚀有助于返回特定的样品位置。

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Batch fabrication of atomic force microscopy probes with recessed integrated ring microelectrodes at a wafer level.在晶圆级批量制造带有嵌入式集成环形微电极的原子力显微镜探针。

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