Continuous measurement of atomic force microscope tip wear by contact resonance force microscopy.
作者信息
Killgore Jason P, Geiss Roy H, Hurley Donna C
机构信息
Materials Reliability Division, National Institute of Standards and Technology, 325 Broadway, Boulder, CO 80305, USA.
出版信息
Small. 2011 Apr 18;7(8):1018-22. doi: 10.1002/smll.201002116. Epub 2011 Mar 15.
PMID:21404440
Abstract
摘要
Zotero 插件