Glover Christopher C, Killgore Jason P, Tung Ryan C
Department of Mechanical Engineering, University of Nevada, Reno, 1664 N Virginia St, Reno, NV 89557, USA.
National Institute of Standards and Technology, Applied Chemicals and Materials Division, 325 Broadway, Boulder, CO 80305, USA.
Beilstein J Nanotechnol. 2018 Mar 21;9:945-952. doi: 10.3762/bjnano.9.87. eCollection 2018.
This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above a critical scan speed, a monotonic decrease in the recorded contact-resonance frequency is observed with increasing scan speed. Proper characterization and understanding of this phenomenon is necessary to conduct accurate quantitative imaging using contact-resonance AFM, and other contact-mode AFM techniques, at higher scan speeds. A squeeze film hydrodynamic theory is proposed to explain this phenomenon, and model predictions are compared against the experimental data.
这项工作展示了数据，证实了接触模式原子力显微镜（AFM）中存在与扫描速度相关的现象。具体而言，使用接触共振光谱来研究这一现象。在高于临界扫描速度时，观察到记录的接触共振频率随着扫描速度的增加而单调下降。为了在更高的扫描速度下使用接触共振原子力显微镜和其他接触模式原子力显微镜技术进行精确的定量成像，对这一现象进行恰当的表征和理解是必要的。提出了一种挤压膜流体动力学理论来解释这一现象，并将模型预测结果与实验数据进行了比较。
