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二维绝缘金刚石颗粒组装体的电化学性质。

Electrochemical properties of two dimensional assemblies of insulating diamond particles.

机构信息

School of Chemistry, University of Bristol, Cantocks close, Bristol, BS8 1TS United Kingdom.

出版信息

Langmuir. 2011 Apr 19;27(8):5112-8. doi: 10.1021/la1045833. Epub 2011 Mar 15.

DOI:10.1021/la1045833
PMID:21405066
Abstract

The electrochemical properties of two-dimensional assemblies of 500 nm type Ib diamond particles are investigated as a function of their surface oxidation state. High Pressure High Temperature particles are sequentially exposed to a hot strong acid bath and to H(2) plasma in order to generate oxygen (ODP) and hydrogen surface terminations (HDP). Changes in the surface composition following the chemical treatments are confirmed by FTIR. Electrophoretic mobility measurements show that the diamond particles exhibit a negative surface charge at pH above 7 independently of the surface termination. Oxidation in the acid bath and subsequent reduction in the H(2) plasma only affects about 30% of the particle surface charge. The intrinsic negative charge allows the formation of 2D assemblies by electrostatic adsorption on poly(diallyldimethylammonium chloride) (PDADMAC) modified In-doped SnO(2) electrodes (ITO). The particle number density in the assembly was controlled by the adsorption time up to a maximum coverage of ca. 40%. Cyclic voltammetry in the absence of redox species in solution show that the acid treatment effectively removes responses associated with sp(2) carbon impurities, resulting in a potential independent capacitive signal. On the other hand, HDP assemblies are characterized by a charging process at a potential above 0.1 V vs Ag/AgCl. These responses are associated with hole-injection into the valence band edge which is shifted to approximately -4.75 eV vs vacuum upon hydrogenation. Information concerning the position of the valence band edge as well as hole number density at the HDP surface as a function of the applied potential are extracted from the electrochemical analysis.

摘要

研究了 500nm 型 Ib 金刚石颗粒二维组装体的电化学性质与其表面氧化态的关系。高压高温颗粒依次暴露于热强酸浴和 H2 等离子体中,以生成氧(ODP)和氢表面末端(HDP)。化学处理后表面组成的变化通过傅里叶变换红外光谱(FTIR)得到证实。电泳迁移率测量表明,金刚石颗粒在 pH 值高于 7 时表现出负表面电荷,与表面末端无关。酸浴中的氧化和随后在 H2 等离子体中的还原仅影响约 30%的颗粒表面电荷。固有负电荷允许通过静电吸附在聚二烯丙基二甲基氯化铵(PDADMAC)修饰的掺铟氧化锡(ITO)电极上形成二维组装体。通过吸附时间控制组装体中的颗粒数密度,最大覆盖率约为 40%。在溶液中不存在氧化还原物种的循环伏安法表明,酸处理有效地去除了与 sp2 碳杂质相关的响应,导致与电位无关的电容信号。另一方面,HDP 组装体的特征是在电位高于 0.1V 相对于 Ag/AgCl 时的充电过程。这些响应与价带边缘的空穴注入有关,在氢化后,价带边缘相对于真空约向-4.75eV 移动。从电化学分析中提取了有关 HDP 表面价带边缘位置以及空穴密度随外加电位的函数关系的信息。

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