Paul Scherrer Institut, CH-5232 Villigen, Switzerland.
Phys Rev Lett. 2011 Jan 21;106(3):036101. doi: 10.1103/PhysRevLett.106.036101. Epub 2011 Jan 18.
The evolution of the atomic structure of LaAlO_{3} grown on SrTiO_{3} was investigated using surface x-ray diffraction in conjunction with model-independent, phase-retrieval algorithms between two and five monolayers film thickness. A depolarizing buckling is observed between cation and oxygen positions in response to the electric field of polar LaAlO_{3}, which decreases with increasing film thickness. We explain this in terms of competition between elastic strain energy, electrostatic energy, and electronic reconstructions. Based on these structures, the threshold for formation of a two-dimensional electron system at a film thickness of 4 monolayers is quantitatively explained. The findings are also qualitatively reproduced by density-functional-theory calculations.
采用表面 X 射线衍射技术,并结合两维和五单层膜厚的无模型相位恢复算法,研究了 SrTiO3 上生长的 LaAlO3 的原子结构演变。在 LaAlO3 的极化电场作用下,观察到阳离子和氧位置之间的去极化屈曲,其随膜厚增加而减小。我们根据弹性应变能、静电能和电子重构之间的竞争来解释这一点。基于这些结构,定量解释了在 4 单层膜厚下形成二维电子系统的阈值。密度泛函理论计算也定性地再现了这些发现。