Gotanda T, Katsuda T, Gotanda R, Tabuchi A, Yamamoto K, Kuwano T, Yatake H, Kashiyama K, Yabunaka K, Akagawa T, Takeda Y
Department of Radiology, Oishi Hospital, Fukuyama City, Hiroshima, Japan.
Australas Phys Eng Sci Med. 2011 Jun;34(2):213-22. doi: 10.1007/s13246-011-0068-2. Epub 2011 Mar 25.
Although the half-value layer (HVL) is one of the important parameters for quality assurance (QA) and quality control (QC), constant monitoring has not been performed because measurements using an ionization chamber (IC) are time-consuming and complicated. To solve these problems, a method using radiochromic film and step-shaped aluminum (Al) filters has been developed. To this end, GAFCHROMIC EBT2 dosimetry film (GAF-EBT2), which shows only slight energy dependency errors in comparison with GAFCHROMIC XR TYPE-R (GAF-R) and other radiochromic films, has been used. The measurement X-ray tube voltages were 120, 100, and 80 kV. GAF-EBT2 was scanned using a flat-bed scanner before and after exposure. To remove the non-uniformity error caused by image acquisition of the flat-bed scanner, the scanning image of the GAF-EBT2 before exposure was subtracted after exposure. HVL was evaluated using the density attenuation ratio. The effective energies obtained using HVLs of GAF-EBT2, GAF-R, and an IC dosimeter were compared. Effective energies with X-ray tube voltages of 120, 100, and 80 kV using GAF-EBT2 were 40.6, 36.0, and 32.9 keV, respectively. The difference ratios of the effective energies using GAF-EBT2 and the IC were 5.0%, 0.9%, and 2.7%, respectively. GAF-EBT2 and GAF-R proved to be capable of measuring effective energy with comparable precision. However, in HVL measurements of devices operating in the high-energy range (X-ray CT, radiotherapy machines, and so on), GAF-EBT2 was found to offer higher measurement precision than GAF-R, because it shows only a slight energy dependency.
尽管半值层(HVL)是质量保证(QA)和质量控制(QC)的重要参数之一,但由于使用电离室(IC)进行测量既耗时又复杂,因此尚未进行持续监测。为了解决这些问题,已开发出一种使用放射变色薄膜和阶梯形铝(Al)滤光片的方法。为此,使用了GAFCHROMIC EBT2剂量测定薄膜(GAF-EBT2),与GAFCHROMIC XR TYPE-R(GAF-R)和其他放射变色薄膜相比,它仅显示出轻微的能量依赖性误差。测量时的X射线管电压分别为120、100和80 kV。在曝光前后使用平板扫描仪对GAF-EBT2进行扫描。为了消除由平板扫描仪图像采集引起的不均匀性误差,在曝光后减去曝光前GAF-EBT2的扫描图像。使用密度衰减率评估半值层。比较了使用GAF-EBT2、GAF-R的半值层和IC剂量计获得的有效能量。使用GAF-EBT2在X射线管电压为120、100和80 kV时的有效能量分别为40.6、36.0和32.9 keV。使用GAF-EBT2和IC的有效能量差异率分别为5.0%、0.9%和2.7%。事实证明,GAF-EBT2和GAF-R能够以相当的精度测量有效能量。然而,在高能范围运行的设备(X射线CT、放射治疗机等)的半值层测量中,发现GAF-EBT2比GAF-R具有更高的测量精度,因为它仅显示出轻微的能量依赖性。