Ulrich O, Biquard X, Bleuet P, Geaymond O, Gergaud P, Micha J S, Robach O, Rieutord F
CEA, INAC, SP2M-NRS, 17 rue des Martyrs, F-38054 Grenoble, France.
Rev Sci Instrum. 2011 Mar;82(3):033908. doi: 10.1063/1.3555068.
A white beam microdiffraction setup has been developed on the bending magnet source BM32 at the European Synchrotron Radiation Facility. The instrument allows routine submicrometer beam diffraction to perform orientation and strain mapping of polycrystalline samples. The setup features large source to optics distances allowing large demagnification ratios and small beam sizes. The optics of the beamline is used for beam conditioning upstream a secondary source, suppressing any possible interference of beam conditioning on beam size and position. The setup has been designed for an easy and efficient operation with position control tools embedded on the sample stage, a high magnification large aperture optical microscope, and fast readout detectors. Switching from the white beam mode to the monochromatic mode is made easy by an automatic procedure and allows the determination of both the deviatoric and hydrostatic strain tensors.
在欧洲同步辐射装置的弯曲磁铁源BM32上开发了一种白色光束微衍射装置。该仪器允许进行常规的亚微米光束衍射，以对多晶样品进行取向和应变映射。该装置的特点是源到光学元件的距离大，允许大的缩小倍率和小的光束尺寸。光束线的光学元件用于在二次源上游进行光束调节，抑制光束调节对光束尺寸和位置的任何可能干扰。该装置的设计便于操作，样品台上嵌入了位置控制工具、高倍率大孔径光学显微镜和快速读出探测器。通过自动程序可以轻松地从白色光束模式切换到单色模式，并允许确定偏应变张量和静水应变张量。
