Department of Engineering Mechanics, Tsinghua University, Beijing, People's Republic of China.
Nanotechnology. 2011 Jul 1;22(26):265706. doi: 10.1088/0957-4484/22/26/265706. Epub 2011 May 17.
We present here a method for cleaning intermediate-size (up to 50 nm) contamination from highly oriented pyrolytic graphite and graphene. Electron-beam-induced deposition of carbonaceous material on graphene and graphite surfaces inside a scanning electron microscope, which is difficult to remove by conventional techniques, can be removed by direct mechanical wiping using a graphite nanoeraser, thus drastically reducing the amount of contamination. We discuss potential applications of this cleaning procedure.
我们在此提出一种从中等到大尺寸（最大 50nm）污染物中清洁高取向热解石墨和石墨烯的方法。电子束诱导的碳质材料在扫描电子显微镜内的石墨烯和石墨表面上的沉积，这是难以用传统技术去除的，可以通过使用石墨纳米橡皮擦直接进行机械擦拭去除，从而大大减少污染物的量。我们讨论了这种清洁程序的潜在应用。
