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关于硅纳米晶体拉伸指数光致发光衰减的本质。

On the nature of the stretched exponential photoluminescence decay for silicon nanocrystals.

作者信息

Zatryb G, Podhorodecki A, Misiewicz J, Cardin J, Gourbilleau F

机构信息

Institute of Physics, Wroclaw University of Technology, Wybrzeze Wyspianskiego 27, 50-370 Wroclaw, Poland.

出版信息

Nanoscale Res Lett. 2011 Jan 31;6(1):106. doi: 10.1186/1556-276X-6-106.

Abstract

The influence of hydrogen rate on optical properties of silicon nanocrystals deposited by sputtering method was studied by means of time-resolved photoluminescence spectroscopy as well as transmission and reflection measurements. It was found that photoluminescence decay is strongly non-single exponential and can be described by the stretched exponential function. It was also shown that effective decay rate probability density function may be recovered by means of Stehfest algorithm. Moreover, it was proposed that the observed broadening of obtained decay rate distributions reflects the disorder in the samples.

摘要

通过时间分辨光致发光光谱以及透射和反射测量,研究了氢气流量对溅射法制备的硅纳米晶体光学性质的影响。发现光致发光衰减强烈非单指数,可用拉伸指数函数描述。还表明有效衰减率概率密度函数可通过斯特费斯特算法恢复。此外,有人提出所观察到的衰减率分布变宽反映了样品中的无序性。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/cecd/3211150/90ed5a1c17d6/1556-276X-6-106-1.jpg

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