Iwanaga Shiho, Toberer Eric S, LaLonde Aaron, Snyder G Jeffrey
Materials Science, California Institute of Technology, Pasadena, California 91125, USA.
Rev Sci Instrum. 2011 Jun;82(6):063905. doi: 10.1063/1.3601358.
A high temperature Seebeck coefficient measurement apparatus with various features to minimize typical sources of error is designed and built. Common sources of temperature and voltage measurement error are described and principles to overcome these are proposed. With these guiding principles, a high temperature Seebeck measurement apparatus with a uniaxial 4-point contact geometry is designed to operate from room temperature to over 1200 K. This instrument design is simple to operate, and suitable for bulk samples with a broad range of physical types and shapes.
设计并制造了一种具有多种特性以最小化典型误差源的高温塞贝克系数测量装置。描述了温度和电压测量误差的常见来源，并提出了克服这些误差的原理。基于这些指导原则，设计了一种具有单轴四点接触几何结构的高温塞贝克测量装置，可在室温至超过1200 K的温度范围内运行。该仪器设计操作简单，适用于各种物理类型和形状的块状样品。
