Cai H Y, Cui D F, Li Y T, Chen X, Zhang L L, Sun J H
State Key Laboratory of Transducer Technology, Institute of Electronics, Chinese Academy of Sciences, China.
Rev Sci Instrum. 2013 Apr;84(4):044703. doi: 10.1063/1.4799968.
A Seebeck coefficient measurement apparatus for high resistance organic semiconductor materials has been designed and built. It can measure materials with resistance over 7 × 10(12) Ω. This is the highest material resistance value ever reported for Seebeck coefficient measurement. A cyclic temperature gradient generation technique and a corresponding algorithm are proposed to eliminate the negative effects of the long term drift of Seebeck voltage. Sources of errors in these measurements are discussed.
