Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK.
Ultramicroscopy. 2011 Jul;111(8):1117-23. doi: 10.1016/j.ultramic.2011.02.005. Epub 2011 Feb 25.
The extended-ptychographical iterative engine (e-PIE) is a recently developed powerful phase retrieval algorithm which can be used to measure the phase transfer function of a specimen and overcome conventional lens resolution limits. The major improvement over PIE is the ability to reconstruct simultaneously both the object and illumination functions, robustness to noise and speed of convergence. The technique has proven to be successful at optical and X-ray wavelengths and we describe here experimental results in transmission electron microscopy supported by corresponding simulations. These simulations show the possibilities - even with strong phase objects - and limitations of ptychography; in particular issues arising from poorly-defined probe positions.
扩展叠层迭代引擎（e-PIE）是一种最近开发的强大的相位恢复算法，可用于测量样本的相位传递函数并克服传统透镜分辨率的限制。与 PIE 相比，其主要改进在于能够同时重建物体和照明函数、对噪声的鲁棒性和收敛速度。该技术已在光学和 X 射线波长上得到验证，我们在此处描述了透射电子显微镜的实验结果，并提供了相应的模拟结果。这些模拟结果展示了叠层术的可能性——即使是对于强相位物体——和局限性；特别是由于探针位置定义不明确而产生的问题。
