Song Jiamei, Allen Christopher S, Gao Si, Huang Chen, Sawada Hidetaka, Pan Xiaoqing, Warner Jamie, Wang Peng, Kirkland Angus I
College of Engineering and Applied Sciences, Nanjing University, Nanjing, 210093, People's Republic of China.
Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK.
Sci Rep. 2019 Mar 8;9(1):3919. doi: 10.1038/s41598-019-40413-z.
Electron ptychography has recently attracted considerable interest for high resolution phase-sensitive imaging. However, to date studies have been mainly limited to radiation resistant samples as the electron dose required to record a ptychographic dataset is too high for use with beam-sensitive materials. Here we report defocused electron ptychography using a fast, direct-counting detector to reconstruct the transmission function, which is in turn related to the electrostatic potential of a two-dimensional material at atomic resolution under various low dose conditions.
电子叠层成像术最近在高分辨率相敏成像方面引起了相当大的关注。然而，迄今为止，研究主要限于耐辐射样品，因为记录叠层成像数据集所需的电子剂量对于对束敏感的材料来说太高了。在这里，我们报告了使用快速直接计数探测器的离焦电子叠层成像术来重建传输函数，该传输函数又与二维材料在各种低剂量条件下的原子分辨率下的静电势相关。
