Han Ying, Corn Robert M
Department of Chemistry, University of California-Irvine, Irvine, California 92697.
J Phys Chem Lett. 2011 Jul 7;2(13):1601-1606. doi: 10.1021/jz200669m.
Arrays of gold nanowires formed by the process of lithographically patterned nanowire electrodeposition (LPNE) were characterized by a combination of SEM, polarized UV-visible absorption spectroscopy and optical diffraction measurements. A transverse localized surface plasmon resonance (LSPR) was observed for gold nanowire arrays with an absorption maximum (λ(max)) that varied with nanowire width. Transmission optical diffraction measurements were measured with the even and odd diffraction orders creating an alternating, out of phase sinusoidal intensity pattern characteristic of the LPNE nanowire arrays. The intensities of the even diffraction order maxima were the strongest for nanowires with a width of 115 ± 10 nm; nanowires of this width exhibit a λ(max) of 635 ± 10 nm, verifying that the transverse LSPR has enhanced the optical diffraction signal. Real time total internal reflection diffraction intensity measurements were used to monitor in situ the electrodeposition of silver monolayers onto the gold nanowire arrays.
通过光刻图案化纳米线电沉积（LPNE）工艺形成的金纳米线阵列，采用扫描电子显微镜（SEM）、偏振紫外可见吸收光谱和光学衍射测量相结合的方法进行了表征。对于金纳米线阵列，观察到了横向局域表面等离子体共振（LSPR），其吸收最大值（λ(max)）随纳米线宽度而变化。通过测量偶数和奇数衍射级次进行透射光学衍射测量，产生了LPNE纳米线阵列特有的交替、异相正弦强度图案。对于宽度为115±10 nm的纳米线，偶数衍射级次最大值的强度最强；这种宽度的纳米线表现出635±10 nm的λ(max)，证实横向LSPR增强了光学衍射信号。利用实时全内反射衍射强度测量原位监测银单层在金纳米线阵列上的电沉积。
