Kizuka Tokushi, Oyama Masaya
Institute of Materials Science, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan.
J Nanosci Nanotechnol. 2011 Apr;11(4):3278-83. doi: 10.1166/jnn.2011.3754.
The functions of scanning near-field optical microscopy (SNOM) were installed in high-resolution transmission electron microscopy (TEM) for cathodoluminescence spectroscopy and photoluminescence spectroscopy of individual nanostructures. Optical fiber probes used in SNOM were allowed to approach nanoparticles by piezomanipulation with simultaneous observation by TEM. As an application of this method, cathodoluminescence and photoluminescence from zinc oxide nanoparticles were measured at room temperature and 130 K. It was demonstrated that the present method directly provides the relationships between structural features of individual nanoparticles and spectra.
扫描近场光学显微镜（SNOM）的功能被安装在高分辨率透射电子显微镜（TEM）中，用于单个纳米结构的阴极发光光谱和光致发光光谱分析。通过压电操作使SNOM中使用的光纤探针接近纳米颗粒，同时利用TEM进行观察。作为该方法的一个应用，在室温及130K下测量了氧化锌纳米颗粒的阴极发光和光致发光。结果表明，该方法直接提供了单个纳米颗粒的结构特征与光谱之间的关系。
