Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, California 94720, United States.
Nano Lett. 2011 Sep 14;11(9):3768-73. doi: 10.1021/nl2018178. Epub 2011 Aug 2.
Monolayer molybdenum disulfide (MoS(2)), unlike its bulk form, is a direct band gap semiconductor with a band gap of 1.8 eV. Recently, field-effect transistors have been demonstrated experimentally using a mechanically exfoliated MoS(2) monolayer, showing promising potential for next generation electronics. Here we project the ultimate performance limit of MoS(2) transistors by using nonequilibrium Green's function based quantum transport simulations. Our simulation results show that the strength of MoS(2) transistors lies in large ON-OFF current ratio (>10(10)), immunity to short channel effects (drain-induced barrier lowering ∼10 mV/V), and abrupt switching (subthreshold swing as low as 60 mV/decade). Our comparison of monolayer MoS(2) transistors to the state-of-the-art III-V materials based transistors, reveals that while MoS(2) transistors may not be ideal for high-performance applications due to heavier electron effective mass (m = 0.45 m(0)) and a lower mobility, they can be an attractive alternative for low power applications thanks to the large band gap and the excellent electrostatic integrity inherent in a two-dimensional system.
单层二硫化钼(MoS2)与体相不同,是一种具有 1.8eV 带隙的直接带隙半导体。最近,使用机械剥离的 MoS2 单层已经实验证明了场效应晶体管,为下一代电子学展示了有前途的潜力。在这里,我们通过使用非平衡格林函数量子输运模拟来预测 MoS2 晶体管的最终性能极限。我们的模拟结果表明,MoS2 晶体管的优势在于大的 ON-OFF 电流比(>1010)、对短沟道效应的免疫(漏极诱导势垒降低约 10mV/V)和急剧的开关(亚阈值摆幅低至 60mV/decade)。我们将单层 MoS2 晶体管与最先进的基于 III-V 材料的晶体管进行了比较,结果表明,虽然 MoS2 晶体管由于较重的有效电子质量(m=0.45m0)和较低的迁移率,对于高性能应用可能不是理想的,但由于大的带隙和二维系统固有的优异静电完整性,它们可能是低功耗应用的有吸引力的替代方案。