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高性能单层锑化钠收缩晶体管:一项密度泛函理论-非平衡格林函数研究

High-performance monolayer NaSb shrinking transistors: a DFT-NEGF study.

作者信息

Zhou Wenhan, Zhang Shengli, Guo Shiying, Qu Hengze, Cai Bo, Chen Xiang, Zeng Haibo

机构信息

Key Laboratory of Advanced Display Materials and Devices, Ministry of Industry and Information Technology, College of Material Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, P. R. China.

出版信息

Nanoscale. 2020 Sep 28;12(36):18931-18937. doi: 10.1039/d0nr04129g. Epub 2020 Sep 10.

Abstract

2D materials with direct bandgaps and high carrier mobility are considered excellent candidates for next-generation electronic and optoelectronic devices. Here, a new 2D semiconductor, NaSb, is proposed and investigated for the performance limits of FETs by ab initio quantum-transport simulations. Monolayer NaSb shows a direct bandgap of 0.89 eV and a high phonon-limited electron mobility of up to 1.25 × 10 cm V s. We evaluated the impact of channel lengths, gate underlaps, oxide thicknesses, and dielectrics on devices. The major figures of merits for FETs are also assessed in terms of the On-Off ratio, subthreshold swing, gate capacitance, delay time, power dissipation, and field-effect mobility, fulfilling the requirements of the International Roadmap for Devices and Systems (IRDS) for high-performance (HP) devices and demonstrating great potential for electronics with novel 2D NaSb.

摘要

具有直接带隙和高载流子迁移率的二维材料被认为是下一代电子和光电器件的优秀候选材料。在此,我们提出了一种新型二维半导体NaSb,并通过从头算量子输运模拟研究了场效应晶体管(FET)的性能极限。单层NaSb显示出0.89 eV的直接带隙和高达1.25×10 cm² V⁻¹ s⁻¹的高声子限制电子迁移率。我们评估了沟道长度、栅极重叠、氧化物厚度和电介质对器件的影响。还根据开/关比、亚阈值摆幅、栅极电容、延迟时间、功耗和场效应迁移率评估了FET的主要性能指标,满足了国际器件和系统路线图(IRDS)对高性能(HP)器件的要求,并展示了新型二维NaSb在电子学方面的巨大潜力。

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