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通过常压化学气相沉积法探究大尺寸高质量单层二硫化钼的生长改进

Probing the Growth Improvement of Large-Size High Quality Monolayer MoS₂ by APCVD.

作者信息

Han Tao, Liu Hongxia, Wang Shulong, Chen Shupeng, Li Wei, Yang Xiaoli

机构信息

Key Laboratory for Wide-Band Gap Semiconductor Materials and Devices of Education, the School of Microelectronics, Xidian University, Xi'an 710071, China.

The School of Mathematics and Statistics, Xidian University, Xi'an 710071, China.

出版信息

Nanomaterials (Basel). 2019 Mar 14;9(3):433. doi: 10.3390/nano9030433.

Abstract

Two-dimensional transition metal dichalcogenides (TMDs) have attracted attention from researchers in recent years. Monolayer molybdenum disulfide (MoS₂) is the direct band gap two-dimensional crystal with excellent physical and electrical properties. Monolayer MoS₂ can effectively compensate for the lack of band gap of graphene in the field of nano-electronic devices, which is widely used in catalysis, transistors, optoelectronic devices, and integrated circuits. Therefore, it is critical to obtain high-quality, large size monolayer MoS₂. The large-area uniform high-quality monolayer MoS₂ is successfully grown on an SiO₂/Si substrate with oxygen plasma treatment and graphene quantum dot solution by atmospheric pressure chemical vapor deposition (APCVD) in this paper. In addition, the effects of substrate processing conditions, such as oxygen plasma treatment time, power, and dosage of graphene quantum dot solution on growth quality and the area of the monolayer of MoS₂, are studied systematically, which would contribute to the preparation of large-area high-quality monolayer MoS₂. Analysis and characterization of monolayer MoS₂ are carried out by Optical Microscopy, AFM, XPS, Raman, and Photoluminescence Spectroscopy. The results show that monolayer MoS₂ is a large-area, uniform, and triangular with a side length of 200 μm, and it is very effective to treat the SiO₂/Si substrate by oxygen plasma and graphene quantum dot solution, which would help the fabrication of optoelectronic devices.

摘要

近年来,二维过渡金属二硫属化物(TMDs)引起了研究人员的关注。单层二硫化钼(MoS₂)是具有优异物理和电学性质的直接带隙二维晶体。单层MoS₂能够有效弥补石墨烯在纳米电子器件领域带隙的不足,在催化、晶体管、光电器件和集成电路中有着广泛应用。因此,获得高质量、大尺寸的单层MoS₂至关重要。本文通过常压化学气相沉积(APCVD),利用氧等离子体处理和石墨烯量子点溶液,在SiO₂/Si衬底上成功生长出大面积均匀高质量的单层MoS₂。此外,系统研究了衬底处理条件,如氧等离子体处理时间、功率以及石墨烯量子点溶液用量对MoS₂单层生长质量和面积的影响,这将有助于大面积高质量单层MoS₂的制备。通过光学显微镜、原子力显微镜、X射线光电子能谱、拉曼光谱和光致发光光谱对单层MoS₂进行分析和表征。结果表明,单层MoS₂大面积、均匀且呈三角形,边长为200μm,利用氧等离子体和石墨烯量子点溶液处理SiO₂/Si衬底非常有效,这将有助于光电器件的制造。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/d175/6474001/27445557cfd9/nanomaterials-09-00433-g001.jpg

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