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硅、锗和 GaP 纳米线中生长界面的周期性形态变化。

Periodically changing morphology of the growth interface in Si, Ge, and GaP nanowires.

机构信息

School of Materials Engineering and Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907, USA.

出版信息

Phys Rev Lett. 2011 Jul 8;107(2):025503. doi: 10.1103/PhysRevLett.107.025503. Epub 2011 Jul 6.

Abstract

Nanowire growth in the standard <111> direction is assumed to occur at a planar catalyst-nanowire interface, but recent reports contradict this picture. Here we show that a nonplanar growth interface is, in fact, a general phenomenon. Both III-V and group IV nanowires show a distinct region at the trijunction with a different orientation whose size oscillates during growth, synchronized with step flow. We develop an explicit model for this structure that agrees well with experiment and shows that the oscillations provide a direct visualization of catalyst supersaturation. We discuss the implications for wire growth and structure.

摘要

人们认为,<111> 方向的纳米线生长发生在平面催化剂-纳米线界面上,但最近的报告却对此观点提出了质疑。在这里,我们表明,非平面生长界面实际上是一种普遍现象。III-V 和 IV 族纳米线在三结处都显示出具有不同取向的明显区域,其大小在生长过程中发生振荡,与阶跃流同步。我们为此结构开发了一个显式模型,该模型与实验吻合得很好,并表明这些振荡为催化剂过饱和度提供了直接的可视化。我们讨论了其对线材生长和结构的影响。

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