Fachbereich Physik, Universität Osnabrück, D-49069 Osnabrück, Germany.
J Phys Condens Matter. 2011 Aug 24;23(33):334218. doi: 10.1088/0953-8984/23/33/334218. Epub 2011 Aug 3.
Holes bound to acceptor defects in oxide materials usually need comparatively high energies, of the order of 0.5-1.0 eV, to be ionized thermally to the valence band maximum. It is discussed that this has to be attributed to the stabilization of such holes by mainly short range interactions with the surrounding lattice, leading to the formation of small O(-) polarons. This is tantamount to the localization of the hole at only one of several equivalent oxygen ions next to the defect. The hole stabilizing energies can be determined experimentally from the related intense optical absorption bands. This paper exploits previous phenomenological studies of bound-hole small polarons in order to account for the large hole stabilization energies on this basis. A compilation demonstrates that bound-hole small polarons occur rather often in oxides and also in some related materials. The identification of such systems is based on EPR and optical studies and also on recent advanced electronic structure calculations.
在氧化物材料中,与受体缺陷结合的空穴通常需要相对较高的能量(约 0.5-1.0 eV)才能被热激发到价带最大值。这是由于空穴主要通过与周围晶格的短程相互作用而稳定,从而形成小的 O(-)极化子。这相当于空穴仅在缺陷附近的几个等效氧离子之一处被局域化。空穴稳定能可以通过相关的强光学吸收带实验来确定。本文利用先前关于束缚空穴小极化子的唯象研究,根据这一基础来解释空穴稳定能的巨大值。文献汇编表明,束缚空穴小极化子在氧化物和一些相关材料中经常出现。这种系统的识别是基于 EPR 和光学研究以及最近的先进电子结构计算。