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在无需刻蚀工艺的情况下,实现了小于 20nm 的超细 ITO 和 ZnRh₂O₄ 纳米线阵列的溶液图案化。

Solution patterning of ultrafine ITO and ZnRh₂O₄ nanowire array below 20 nm without etching process.

机构信息

Department of Mechanical Engineering, the Hong Kong Polytechnic University, Kowloon, Hong Kong.

出版信息

Nanoscale. 2011 Sep 1;3(9):3598-600. doi: 10.1039/c1nr10479a. Epub 2011 Aug 4.

Abstract

Transparent conductive patterns have significant applications in various optoelectronic devices. A low cost solution process to directly fabricate transparent conductive oxide nanopatterns was developed without a conventional lithographic or etching process. A uniform and high density array of ITO and ZnRh(2)O(4) nanopatterns was fabricated with block copolymer self-assembly and spin coating technology. A low resistivity of about 3-9 × 10(-4)Ω cm and high transmission of 90% in the visible spectrum region was demonstrated with uniform ITO nanopatterns with feature size of 24 nm. The first p-type ZnRh(2)O(4) nanopattern was also fabricated with low resistivity and small feature size of 15 nm. This cost-efficient and large area scalable process can fabricate patterns with feature size down to sub-20 nm, providing a faster patterning capability compared to conventional photolithography and etching processes.

摘要

透明导电图案在各种光电设备中具有重要的应用。本文提出了一种低成本的解决方案,无需传统的光刻或刻蚀工艺,即可直接制备透明导电氧化物纳米图案。采用嵌段共聚物自组装和旋涂技术,制备了均匀且高密度的 ITO 和 ZnRh(2)O(4)纳米图案阵列。通过对具有 24nm 特征尺寸的均匀 ITO 纳米图案进行实验,实现了低电阻率(约 3-9×10(-4)Ωcm)和高透光率(可见光区 90%)。此外,还首次制备了低电阻率和小特征尺寸(15nm)的 p 型 ZnRh(2)O(4)纳米图案。这种具有成本效益且可大面积扩展的工艺可以制备出特征尺寸低至 20nm 以下的图案,与传统的光刻和刻蚀工艺相比,具有更快的图案化能力。

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