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脉冲长度和脉冲强度对电穿孔转染的影响。

Effects of pulse length and pulse strength on transfection by electroporation.

作者信息

Kubiniec R T, Liang H, Hui S W

机构信息

ElectroCell, Inc., Buffalo, NY 14263.

出版信息

Biotechniques. 1990 Jan;8(1):16-20.

PMID:2182073
Abstract

The relative importance of pulse field strength E and pulse length tau 1/2 (half decay time of an exponential decay pulse) on the stable transfection frequency for HeLa or HUT-78 cells was investigated. Cells were transfected with plasmids containing the promoter and drug resistant genes pRSVgpt or pRSVneo by electroporation. The stable transfection frequency was assayed using the marker rescue technique. The transfection frequency increases with increasing values of E tau 1/2. For a given pulse length, the transfection frequency is proportional to the power of the pulse (E2 tau 1/2). Pulses with half decay times of 2.2 to 4.6 ms appear to be more efficient than 0.275 to 0.31 ms for stable transfection of HeLa cells.

摘要

研究了脉冲场强E和脉冲长度τ1/2(指数衰减脉冲的半衰减时间)对HeLa或HUT - 78细胞稳定转染频率的相对重要性。通过电穿孔法用含有启动子和抗药基因pRSVgpt或pRSVneo的质粒转染细胞。使用标记拯救技术测定稳定转染频率。转染频率随Eτ1/2值的增加而增加。对于给定的脉冲长度,转染频率与脉冲功率(E2τ1/2)成正比。对于HeLa细胞的稳定转染,半衰减时间为2.2至4.6毫秒的脉冲似乎比0.275至0.31毫秒的脉冲更有效。

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