Martínez N F, Lozano J R, Herruzo E T, Garcia F, Richter C, Sulzbach T, Garcia R
Instituto de Microelectrónica de Madrid, CSIC, Isaac Newton 8, 28760 Tres Cantos, Madrid, Spain.
Nanotechnology. 2008 Sep 24;19(38):384011. doi: 10.1088/0957-4484/19/38/384011. Epub 2008 Aug 12.
We have developed a dynamic atomic force microscopy (AFM) method based on the simultaneous excitation of the first two flexural modes of the cantilever. The instrument, called a bimodal atomic force microscope, allows us to resolve the structural components of antibodies in both monomer and pentameric forms. The instrument operates in both high and low quality factor environments, i.e., air and liquids. We show that under the same experimental conditions, bimodal AFM is more sensitive to compositional changes than amplitude modulation AFM. By using theoretical and numerical methods, we study the material contrast sensitivity as well as the forces applied on the sample during bimodal AFM operation.
我们基于对悬臂梁前两个弯曲模式的同时激发，开发了一种动态原子力显微镜（AFM）方法。该仪器称为双峰原子力显微镜，使我们能够分辨单体和五聚体形式抗体的结构成分。该仪器可在高和低品质因数环境下运行，即空气和液体环境。我们表明，在相同实验条件下，双峰AFM比振幅调制AFM对成分变化更敏感。通过使用理论和数值方法，我们研究了双峰AFM操作过程中的材料对比度灵敏度以及施加在样品上的力。
