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电场变化的电子全息研究

Electron holography study of electric field variations.

作者信息

Shindo Daisuke, Murakami Yasukazu

机构信息

Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.

出版信息

J Electron Microsc (Tokyo). 2011;60 Suppl 1:S225-37. doi: 10.1093/jmicro/dfr017.

DOI:10.1093/jmicro/dfr017
PMID:21844592
Abstract

This paper presents a review of the recent electron holography studies on electric field variation that have been carried out using multifunctional specimen holders. In addition to the standard inner potential analysis, studies on electric field variations around field emission tips have been carried out. The electric field variations caused by ballistic emission in the case of a field emitter made of a TaSi(2) nanowire have been analyzed using electron holography. The charges and electric fields in electrophotographic materials such as toner particles and organic photoconductors have been quantitatively evaluated after equipping the specimen holder with a piezodriving probe to shield the specimens from electron irradiation. The conductivity and electric field variations in the case of Ag-based conductive adhesives have been analyzed by applying an electric current through the holder. Finally, the characteristic charging effect induced by electron irradiation in biological specimens has been studied. It has also been pointed out that under certain experimental conditions, the stationary orbits of electron-induced secondary electrons can be located by electric field visualization.

摘要

本文综述了近期利用多功能样品杆开展的关于电场变化的电子全息研究。除了标准的内电势分析外,还开展了场发射尖端周围电场变化的研究。利用电子全息术分析了由TaSi(2)纳米线制成的场发射体在弹道发射情况下引起的电场变化。在样品杆配备压电驱动探针以保护样品免受电子辐照后,对调色剂颗粒和有机光电导体等电子照相材料中的电荷和电场进行了定量评估。通过向样品杆施加电流,分析了银基导电胶情况下的电导率和电场变化。最后,研究了生物样品中电子辐照引起的特征充电效应。还指出,在某些实验条件下,可通过电场可视化来定位电子诱导二次电子的稳定轨道。

相似文献

1
Electron holography study of electric field variations.电场变化的电子全息研究
J Electron Microsc (Tokyo). 2011;60 Suppl 1:S225-37. doi: 10.1093/jmicro/dfr017.
2
Multifunctional TEM-specimen holder equipped with a piezodriving probe and an electron irradiation port.配备压电驱动探针和电子辐照端口的多功能透射电子显微镜样品台。
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Microscopy (Oxf). 2017 Jun 1;66(3):167-171. doi: 10.1093/jmicro/dfw112.

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